SAE ARP6338A

SAE ARP6338A – Process for Assessment and Mitigation of Early Wearout of Life-Limited Microcircuits

This document is intended for use by designers reliability engineers and others associated with the design production and support of electronic sub-assemblies assemblies and equipment used in AADHP applications to conduct lifetime assessments of microcircuits with the potential for early wearout; and to implement mitigations when required; and by the users of the AADHP equipment to assess those designs and mitigations.

This document focuses on the LLM wearout assessment process. It acknowledges that the AADHP system design process also includes related risk mitigation and management; however this document includes only high-level reference and discussion of those topics in order to show their relationship to the LLM assessment process.

Product Details

Published:

02/08/2019

File Size:

1 file 400 KB

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