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SAE J784A_197108
Original price was: $167.$100Current price is: $100.
Residual Stress Measurement by X-Ray Diffraction
| Published by | Publication Date | Number of Pages |
| SAE | 1971 | 124 |
SAE J784A – Residual Stress Measurement by X-Ray Diffraction
Product Details
- Published:
- 08/01/1971
- Number of Pages:
- 124
- File Size:
- 1 file 8.9 MB
- Note:
- This product is unavailable in Ukraine Russia Belarus
